3月 07

Overview of JP Patent Examination for IoT, AI related applications

テーマ:Overview of JP Patent Examination for IoT, AI related applications
スピーカー:橋本 宏之 氏/志賀国際特許事務所
日時:2019年03月07日(木)9時30分~11時 30分
会場:在日ドイツ商工会議所

イベントについて

Under the so-called “the fourth industrial revolution”, applicable filed of IoT/AI are no longer limited to Software/electrical field but has been expanding to fields of machinery, material sciences, chemical, and Bio-tech.


Further, in IP fields, grant rate of machine learning related patent application reaches up to more than 80%.  Now, IoT/AI related patent is receiving an enormous boost of Pro-patent situation.

The present seminar provides a schematic overview of JP Patent Examination for IoT/AI related applications.  Specifically, the present lecture provides information of Examination Guideline for IoT/AI related application updated by JPO in March 2017, and would like to share ideas how to draft specification, in particular claims.


Contents:

  • Overview of Computer Software-Related Inventions
  • žComparison with other Jurisdictions
  • žPatent Eligibility
  • žNovelty and Inventive Step
  • žSub combination

 

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